MSE 5035 - Electron Microscopy Techniques

This course covers the fundamental operating principles and techniques of scanning electron microscopy (SEM). It will provide thorough knowledge about the electron-specimen interactions, electron optics, image processing, energy-dispersive X-ray spectrometry, quantitative X-ray microanalysis, and advanced specimen preparation techniques. Effects of microscopy variables on the image and the use of various state-of-the-art microscope accessories and outputs will be discussed.